Glass thickness gauge EddyCus® TF lab 2020SR

filmnon-contactfor aeronautics

The EddyCus® TF lab 2020 Series allows manual single point measurements of conductive thin films and layer thickness measurement of thin metal layers in non-contact mode. The compact bench-top device is ideal for fast and accurate measurements of samples up to 200 x 200 mm² (8 x 8 inches). In addition to the measurement of thin conductive layers also doped wafers and conductive polymers can be analyzed. Highlights Non-contact real time measurement Precise measurement of conductive thin films Characterization of hidden and encapsulated conductive layers Measurement data saving and export functions Characteristics Sheet resistance Thickness measurement of metal layers Single point measurement Quality control, input and output control Sample sizes: 10 x 10 mm² to 200 x 200 mm² (0.5 x 0.5 inches to 8 x 8 inches) Measurement range: 0.1 mOhm/sq to 100 kOhm/sq Applications Coated architectural glass, e.g. LowE Displays, touch screens and flat panel displays OLED and LED applications Smart glass Graphene layers Photovoltaic wafers and cells Semiconductor wafers Metallization layers and wafer metallization De-icing and heating applications Battery electrodes Conductively coated paper and conductive textiles