Coating thickness gauge EddyCus® TF map 2525SR

filmnon-contactfor aeronautics

The Eddy­Cus® TF map 2525 Series auto­mat­ic­ally images characteristics on samples up to 250 x 250 mm² (10 x 10 inches) in non-con­tact mode. Upon manu­al sample po­s­i­tion­ing the device auto­mat­ic­ally meas­ures and dis­plays the distribution of properties across the en­tire sample area. The meas­ure­ment set­tings al­low eas­ily and flex­ibly to choose between fast meas­ure­ment times of be­low 1 minute or high spa­tial meas­ure­ment res­ol­u­tion of more than 50,000 meas­ure­ment points per sample. The resulting mapping provides a true insight to homogeneity and quality of transparent and non-transparent layers or wafer and metal sheets. The bench-top device allows depending of its setup the precise imaging of sheet resistance, metal thickness or optical transparency. Highlights Non-contact Fast and precise measurement High resolution mapping of conductive thin films Imaging of substrates up to 250 x 250 mm (10 x 10 inches) Defect detection and coating analysis Characterization even of hidden and encapsulated conductive layers Various software-integrated analysis functions (e.g. sheet resistance distribution, line scans, single point analysis) Measurement data saving and export functions Types The device platform is available in different sensor configurations including eddy current sensors for electrical characterization or sensors for optical characterization. Variants of the measurement configurations involve the following options. Characteristics Technology: non-contact eddy current Imaging by multipoint mapping Thin layer uniformity control Quality control, input and output control Positioning area: 300 mm x 270 mm