PRODUCT HIGHLIGHTS- Minimal footprint
- Dual-view imaging
- High-resolution 24-bit color images
- Enhanced material discrimination
- Windows OS with Intel® Core™ processor
- Real-time diagnostics
- High-contrast image analysis
PRODUCT INFORMATIONThe XIS-7858DVS™ is a dual-view X-ray inspection system designed for screening small- to moderately-sized objects in confined locations. Its compact footprint enables installation in high-traffic security checkpoints and restricted spaces.
The system's dual-imaging architecture provides two independent views of scanned items, allowing operators to manipulate each view and perform multi-mode screening simultaneously. Combined with Astrophysics imaging software, the XIS-7858DVS™ supports rapid, thorough inspections of complex bags and parcels, improving throughput at busy screening lanes.
TECHNICAL SPECIFICATIONS- Model: XIS-7858DVS™
- Imaging: Dual-view X-ray imaging
- Generator: Dual 180 kV
- Image quality: High-resolution 24-bit color
- Material discrimination: Enhanced material discrimination capabilities
- Software: Astrophysics imaging software for multi-mode screening and independent view manipulation
- Operating system / Processor: Windows OS with Intel® Core™ Processor
- Diagnostics: Real-time diagnostics
- Analysis: High-contrast image analysis
- Physical footprint: Minimal footprint for confined locations
- Intended use: Screening small- to moderately-sized bags and parcels; suited for high-traffic security checkpoints
- Tunnel size: 77.7 cm x 57.9 cm (30.6" x 22.8")
- Dimensions (L x W x H): 259.7 cm x 134.6 cm x 147.3 cm (102.2" x 53.0" x 58.0")