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NDT flaw detector microwavefor aeronauticsfor GFRP
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Characteristics
- Technology
- microwave
- Applications
- for aeronautics, for GFRP, for NDT, for leaf spring
Description
The FIT-M offers user specific, production integrated inspection systems to detect defects in parts made from non-conducting material. Examples are plastics, glass fiber reinforces plastics, wood, ceramics etc.
*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.