Unique temperature-compensated surface and trace copper thickness
ACCURATE IN-PROCESS INSPECTION RESULTS REGARDLESS OF COPPER TEMPERATURE
Temperature can affect the measurement on a copper sample.
Our CMI165® can compensate for the temperature to produce accurate in-process inspection results regardless of the temperature of the copper. It is an ideal gauge for quality assurance and inspection for:
PCM manufacturing and assembly.
Copper surface thickness.
Our CMI165® gauge is versatile and portable. It comes equipped with a protective case and its durable design can be taken into the harshest environments. The CMI165® is a good choice to:
Measure Cu on hot or cold PCBs.
Reduce waste by eliminating the need for coupons.
Measure Cu thickness on foils or laminates in μm, mils or oz.
Illuminated probe tip for easy
User interface in English or
PROPRIETARY SRP-T1 MEASUREMENT PROBE
Replaceable Probe Tip – no recalibration necessary.
Ensures no factory downtime.
4-point electrical probe with resistance method to ensure compliane with EN 14571.
High repeatability and reliability.
Statistical analysis includes data recording, average, standard deviation and high-low reporting.
Factory calibrated and certified.
Customizable for specific applications.
Static or continuous mode measurement.
Powered by AA batteries.