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Phased array flaw detector Surftest SJ-210
for aeronautics

phased array flaw detector
phased array flaw detector
phased array flaw detector
phased array flaw detector
phased array flaw detector
phased array flaw detector
phased array flaw detector
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Characteristics

Technology
phased array
Applications
for aeronautics

Description

This is a portable measuring instrument that allows you to easily and accurately measure surface roughness. The Surftest SJ-210 offers you the following benefits: Skid system gives you user friendly and intuitive menu navigation. It works independently of mains power, allowing you to make on-site measurements. The 6.0 cm [2.4 colour graphic, back-lit LCD gives you excellent readability. It performs roughness analyses conform to various international standards (EN ISO, VDA, ANSI, JIS) and customized settings. Different drivers expanding the range of applications. Calculation results, assessed profiles, bearing and amplitude curves can be displayed. Support of 21 languages. Operation by keys on the front and under the sliding cover. Detector measuring force: 0.75 mN Stylus tip angle: 60° Stylus tip radius: 2 µm Mass: 500 g Measuring range: 16 mm, 4.8 mm [S-type] Traverse: 17.5 mm, 5.6 mm [S-type] Measuring speed: 0.25 mm/s; 0.5 mm/s; 0.75 mm/s Cable length: 1 m Measuring method: Differential inductance Range: 360 µm Stylus: Diamond Tip Skid radius: 40 mm Profiles: Roughness Profile (R), R-Motif, DF-Profile and more Display range: Ra, Rq: 0.01 µm - 100 µm Ry, Rz, Rt, R3z, Rvk, Rpk, Rk, Rp: 0.02 µm - 350 µm Vo: 0 - 10 (mm3/cm2) S, Sm: 2 µm - 4000 µm Pc: 2.5/cm - 5000/cm Mr 1, Mr 2: 0 - 100 % mr: 1 - 100 % Roughness standard: EN ISO, VDA, JIS, ANSI and customize settings Sampling length (L): 0.25 mm, 0.8 mm, 2.5 mm

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