nikon metrology bridge cmm altera slThe ALTERA SL features a revolutionary design that delivers the best scanning and inspection performance currently available in the marketplace. Particularly suited to meet the demands of automotive and aerospace applications, the ALTERA SL is a unique and distinctive multi-sensor CMM. With the HA option, such a system becomes a metrology lab reference CMM featuring submicron accuracy for applications requiring highest precision.
Increased scanning performance delivering high accuracy and throughput
Increased stiffness and stability of the metrology frame
Ready for shop floor and metrology lab