X-ray inspection system Phoenix Microme|x Neo

surfaceaeronautical3D

Premium nanofocus and microfocus inspection for electronics The Phoenix Microme|x Neo and Nanome|x Neo provide high-resolution 2D X-ray technology, PlanarCT and 3D computed tomography (CT) scanning in one system. With innovative engineering coupled with ultra-high positioning accuracy, Phoenix Microme|x Neo and Nanome|x Neo are ideally suited for industrial X-ray electronics inspections in process and quality control for greater productivity, failure analysis for the increased safety and quality of your products, and R&D where innovations are born. Both enableautomated X-ray inspection (AXI) of electronic components - such as semiconductors, PCBs, electronic assemblies, sensors and lithium-ion batteries - in industrial, automotive, aviation and consumer electronics industries. Non-destructive electronics inspection starts here Innovative and unique features and an extremeCT high positioning accuracy make both the phoenix MicromeIx 160 and 180 neo and the NanomeIx 180 neo the effective and reliable solution for a wide spectrum of 2D and 3D offline inspection tasks: R&D, failure analysis, process and quality control. The Phoenix|x-ray X|act inspection software offers easy to program CAD based µAXI ensuring automated inspection in the micrometer range. Another unique benefit is Waygate Technologies highly dynamic DXR flat panel detector with active cooling. Offering up to 30 frames per second, it provides outstanding brilliant live imaging and fast data acquisition for 3D CT. Highlights Benefits: Brilliant live inspection images due to high dynamic Waygate DXR digital detector array