Surface data acquisition unit QuickScan iX ECA

for aerospace applicationshigh-speedwithout display

Powerful Eddy Current Array Solution for In-Process Surface Inspection The QuickScan iX ECA acquisition instrument is specifically designed for surface inspections in a material production environment. Its design meets the same reliable 24 V I/O industrial standards as the field proven QuickScan iX PA instrument. Up to eight probes can be connected per unit. Several acquisition units can be combined for more demanding configurations in terms of probes or speed. Build to Withstand Industrial Demands The QuickScan iX ECA instrument is our latest generation of eddy current acquisition units for industrial inspection systems. The acquisition unit meets IP55 standards and easily integrates into industrial environments. Expandable for High-Speed Inspection Needs Up to eight probes can be connected per unit. Several acquisition units can be combined for more demanding configurations involving more probes or higher speed requirements. Excitation Modes - Single or multifrequency mode. Multiplexed mode allowing time multiplexing of up to two simultaneous frequencies. Number of Coil Drivers - 2 independent generator outputs Number of Input/Time Slots - Max 2 inputs per smart probe connector Max 8 inputs for legacy connector 8 inputs total for the instrument, 32 time slots each for a total of 256 time slots Frequency Range - 50 kHz to 2 MHz Output Impedance, per ISO 15548-1 Section 6.2.3 - < 1.5 Ω typical at 480 kHz, current limited Maximum Output Load, per ISO 15548-1 Section 6.2.5 - Up to 9W typical at 480 kHz Probe inputs Input Impedance, 16-pin Connector, per ISO 15548-1 Section 6.3.2 - 850 kΩ typical