nikon metrology xray ct computed tomography XTH225STThe XT H 225 ST is a Computed Tomography (CT) system ideally suited to a wide range of materials and sample sizes, especially those that are too large or heavy for other systems in the range. the system has three interchangeable sources; the 225 kV reflection target, 180 kV transmission target and the optional 225 kV rotating target. Combined with the wide range of flat panel detectors to choose from, the ST system provides a flexible tool for quality laboratories, production facilities and research departments.
Proprietary 225 kV microfocus X-ray source with 3 µm focal spot size
Easy system operation
Stunning images providing maximum insight
High performance image acquisition and volume processing
Straightforward inspection automation
Safety by design