The integration of industry-leading features into the XT H 225 ST 2x microfocus X-ray CT system allows a doubling of data acquisition speed and hence of inspection productivity. It is a result of using advanced detector technology combined with new functionality including Half.Turn CT and Rotating.Target 2.0.
Instead of rotating the sample under investigation through 360 degrees while the X-rays directed at it are either absorbed or pass through to the detector, Nikon Metrology has devised a method that allows sufficient data to be obtained by rotating the sample through just over 180 degrees.
Complete in-house control over the development of world-leading reconstruction software has facilitated the Half.Turn CT breakthrough, as it enabled the introduction of novel automatic center of rotation calculation coupled with optimization of the reconstruction algorithm. Together they eliminate artifacts introduced by rotating a sample through less than 360 degrees. As a consequence, an image is produced automatically without loss of quality or accuracy from about half of the data usually acquired with conventional CT.
Nikon Metrology is the only company in the world to supply X-ray CT systems with a rotating target technology. Other products on the market, which use heat-absorbing materials, require cool-down periods and may have power limitations, but the unique 225kV rotating target allows continuous operation across its entire power range up to 450W for superior inspection productivity.
The liquid-cooled, rotating target technology adds further capabilities for power, resolution and reduction of scan time.