New revolutionary Dual Side-On Interface (DSOI) technology that achieves twice the sensitivity of conventional radial-plasma-view instruments
TI technology enables highest sensitivity for trace elements, as well as freedom from matrix interferences plus good accuracy for challenging environmental matrices
New GigE readout system that enables spectra transport in less than 100 ms for faster analysis speeds, shorter sample-to-sample times, and more samples per hour
Extremely agile, LDMOS generator that makes external cooling unnecessary: analyze difficult sample matrices in lower dilutions for lower limits of detection — faster warmup (~10 minutes) for higher productivity
SPECTRO’s new DSOI technology, a brand-new approach to the critical issue of plasma view design, uses a vertical plasma torch, observed via a new direct radial-view technology. Two optical interfaces capture emitted light from both sides of the plasma, using only a single extra reflection, for added sensitivity and elimination of issues plaguing newer vertical-torch dual-view models. As a result, DSOI provides twice the sensitivity of conventional radial systems — yet avoids the complexity, drawbacks, and cost of vertical dual view models.
The Twin Interface model automatically combines both axial and radial plasma views — looking both across the plasma and from end-to-end — optimizing sensitivity, linearity, and dynamic range while avoiding matrix effects like EIE. The result: SPECTROGREEN TI offers the highest sensitivity for trace elements, as well as freedom from matrix interferences plus good accuracy for challenging environmental matrices.