Baggage scanner XIS-6545DV™

inspectionfor airportX-ray

Product information
The XIS-6545DV™ is an X-Ray Inspection System (XIS) configured for dual-view screening. Its dual 180 kV generators provide upward and diagonal imaging angles. Each view can be controlled independently to support rapid, in-depth inspections and simultaneous use of different screening modes.
With Astrophysics imaging software, the XIS-6545DV™ delivers high-contrast, colorized images to help operators identify materials, recognize objects and isolate potential threats with improved speed and accuracy.

Product highlights

• Dual-view imaging (upward and diagonal)
• High-resolution images with 24-bit color
• Enhanced material discrimination
• Windows operating system with Intel® Core™ Processor
• Real-time diagnostics and system monitoring
• High-contrast image analysis and color filters

Specifications
Generator:
Dual 180 kV
Tunnel size:
65.7 cm x 45.1 cm (25.9" x 17.8")
Length:
213.3 cm (84.0")
Width:
101.6 cm (40.0")
Height:
129.0 cm (50.8")

Technical specifications

• Model: XIS-6545DV™
• System type: Dual-view X-Ray Inspection System
• Generator: Dual 180 kV
• Tunnel size: 65.7 cm x 45.1 cm (25.9" x 17.8")
• Dimensions (L x W x H): 213.3 cm x 101.6 cm x 129.0 cm (84.0" x 40.0" x 50.8")
• Imaging: Dual-view, high-resolution 24-bit color; enhanced material discrimination; high-contrast analysis
• Software/OS: Windows OS with Intel® Core™ Processor; real-time diagnostics