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Baggage scanner XIS-6545DVS™
inspectionfor airportX-ray

Baggage scanner - XIS-6545DVS™ - Astrophysics Inc.  - inspection / for airport / X-ray
Baggage scanner - XIS-6545DVS™ - Astrophysics Inc.  - inspection / for airport / X-ray
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Characteristics

Applications
baggage, inspection
Sector
for airport
Type
X-ray
Other characteristics
with conveyor

Description

PRODUCT HIGHLIGHTS
  • Dual-view imaging
  • High-resolution 24-bit color images
  • Enhanced material discrimination
  • Windows OS with Intel® Core™ processor
  • Real-time diagnostics
  • High-contrast image analysis


PRODUCT INFORMATION
The XIS-6545DVS™ is an X-ray inspection system engineered with dual imaging generators to capture simultaneous, independent views of objects and baggage, reducing blind spots and improving detection accuracy. Each view is accessible and reviewable independently via Astrophysics’ multi-colored, high-contrast screening software.
The system's high-resolution imaging and 24-bit color output increase throughput by reducing time spent on false alarms and manual rechecks, supporting faster processing in operational environments.

CHARACTERISTICS / TECHNICAL SPECIFICATIONS
  • Generator: Dual 180kV
  • Tunnel Size: 65.0 cm x 45.2 cm (25.6" x 17.8")
  • Length: 204.0 cm (80.3")
  • Width: 128.2 cm (50.5")
  • Height: 135.0 cm (53.1")

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.
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