Product Highlights- Compact, narrow footprint for limited-space deployments
- High-resolution 24-bit color imaging with high-contrast analysis
- Enhanced material discrimination for faster threat identification
- Windows OS with Intel® Core™ processor
- Real-time system diagnostics
- Wide tunnel (62.0 cm x 45.0 cm) in a compact chassis
Product InformationThe XIS-6545N™ is a compact X-Ray Inspection System designed for checkpoints and tight installations. With a narrow external frame and a wide 62.0 cm x 45.0 cm (24.4" x 17.7") tunnel, it screens a broad range of objects while minimizing footprint. Using Astrophysics' imaging technology, operators receive high-definition, 24-bit color images with strong contrast to discriminate between materials and locate potential threats quickly and accurately. The system runs on a Windows operating system with an Intel® Core™ processor and provides real-time diagnostics for continuous operation and rapid troubleshooting.
Specifications (summary)- Generator: 160 kV
- Tunnel size: 62.0 cm x 45.0 cm (24.4" x 17.7")
- Length: 153.4 cm (60.4")
- Width: 83.7 cm (32.9")
- Height: 130.5 cm (51.4")
Technical specifications- Imaging: High-resolution 24-bit color; high-contrast image analysis
- Material discrimination: Enhanced material discrimination capabilities
- Platform: Windows OS with Intel® Core™ processor
- Diagnostics: Real-time diagnostics
- Design: Compact chassis with narrow footprint and wide tunnel for checkpoint/limited-space deployment