Data acquisition software Sherpa

measurementdata analysisautomation

Overview
Sherpa is topography measurement software for Polytec TopMap profilers. It streamlines surface metrology with an adaptive user interface, guided workflows, intelligent automation and advanced analysis tools to support quick measurements for newcomers, high‑throughput routine inspections and deep evaluations for experts.

Key benefits

• Adaptive, role‑aware UI that shows only options relevant to the current step and user role.
• Faster setup and fewer operator errors through guided workflows and Virtual Positioning.
• Reliable acquisition on challenging surfaces using Smart Scanning Technology and automated HDR exposure control.
• Traceable, transparent results with live filtering, raw data access and expert analysis tools.
• Automation (recipes, pattern matching, tray measurement) for reproducible, high‑throughput inspections.

Core functions

• Operation — adaptive UI and role‑based views to reduce complexity and shorten onboarding.
• Preparation — Virtual Positioning, Focus Finder & Focus Tracker, Auto‑level and simplified axis control for reliable setup.
• Acquisition — Smart Scanning Technology & automated HDR exposures to handle surfaces with varying reflectivity.
• Analysis — Live filtering, smart filter presets, expert mode, raw data access and the Line Analyzer for in‑depth inspection.
• Automation — reusable recipes, pattern matching and tray measurement for automatic handling of identical parts.

Features & capabilities

• Guided, adaptive workflows with dark/light modes and role management.
• Virtual Positioning: click‑to‑position with coarse and fine movements (no hardware joystick required).
• Focus Finder & Focus Tracker and Auto‑level for precise targeting and alignment.
• Smart Scanning & HDR: automatic exposure addition and fine‑tuning during acquisition for mixed‑reflectivity surfaces.
• Live filtering and raw data access for immediate validation and outlier checks.
• Line Analyzer: interactive profile evaluation (peak‑to‑valley, angles, distances) by dragging start/end points.
• Automation tools: recipes, optional barcode triggering, pattern matching and tray measurement for routine inspections.
• Environmental Compensation Technology (ECT) to compensate vibration and disturbances on noisy shop floors.
• True View / True Stitching for enhanced texture detail across large height differences.
• Open architecture and integration via serial/field buses, TCP/IP and custom parameters.
• Standards‑based evaluation support (examples: ISO 25178, DIN EN ISO 4287), subject to system configuration and software version.

Compatible systems

• Polytec TopMap profiler family: Micro.View, Micro.View+, Metro.Lab, Pro.Surf, Pro.Surf+. Exact compatibility depends on system configuration and software version.

Launch information
Special launch conditions available for a limited period (example: until 30 September 2026).

Technical specifications

• Software name: Sherpa
• Designed for: Polytec TopMap profilers (microscope‑based and large‑area optical profilers)
• Operation modes: adaptive UI (role/workflow adaptive), expert mode with full parameter access
• Positioning helpers: Virtual Positioning, Focus Finder, Focus Tracker, Auto‑level
• Acquisition helpers: Smart Scanning Technology, automated HDR exposure management
• Analysis tools: Live filtering, raw data access, smart filter presets, Line Analyzer
• Automation: recipes, barcode‑triggered recipes, pattern matching, tray measurement
• Environmental handling: Environmental Compensation Technology (ECT)
• Integration: serial / field buses, TCP/IP (open architecture)
• Standards: ISO 25178, DIN EN ISO 4287 (subject to system/version)